Combined XPS, AFM, TEM and ellipsometry studies of nanoscale layers in organic light emitting diodes

Suess C., Wenzl F.P., Jakopic G., Wuchse M., Muehlegger S., Koch N., Haase A., Lamprecht K., Schatzmayr M., Mitterbauer C., Hofer F., Leising G.
Combined XPS, AFM, TEM and ellipsometry studies of nanoscale layers in organic light emitting diodes. Surf. Sci., 507-510 (2002), p. 464, 2004