We use cookies

We use cookies on our website. Some of them are essential while others help us improve this website and your experience.


Scientific publication

Combined XPS, AFM, TEM and ellipsometry studies of nanoscale layers in organic light emitting diodes

Publication from Materials

Suess C., Wenzl F.P., Jakopic G., Wuchse M., Muehlegger S., Koch N., Haase A., Lamprecht K., Schatzmayr M., Mitterbauer C., Hofer F., Leising G.

Surf. Sci., 507-510 (2002), p. 464, 2004