NILecho II

TEM image of a section through a structured NIL OECT (a) and by a SA-OTFT (c); Elemental analysis of the section (b, d); Image of a structured OECT NIL (e); Completely printed, segmented electrochromic display (f, g).

Electronic circuits by hot
embossed organic devices II

The goal of the NILecho II project is to combine nanoimprint lithography (NIL) and printed electronics, which makes it possible to produce rapid, flexible circuits using semi-industrial production methods. This technology makes it possible to produce electronic components on a large scale that are as inexpensive as printed paper, as large as blackboards and as flexible as plastic wrap. Thus, printed electronics can advance to an industrially relevant level of technology.

The sample preparation and electrical characterization is carried out by Joanneum Research. Cross-sectional and material characterization of the components is conducted by the Center for Electron Microscopy in Graz, while the electrical measurement systems have been developed and manufactured by mb technologies. As part of the project, the following areas will be explored:


  • Self-adjusting NIL structured organic thin film transistors (SA-OTFT) are made from printable material.
  • Completely printed organic electrochemical transistors (OECT) and logic circuits (NAND, NOR, flip-flop).
  • NIL structured, fully printed electrochemical transistors and logic circuits.
  • Combinations of printed circuits and completely printed electrochromic displays