Combined XPS, AFM, TEM and ellipsometry studies of nanoscale layers in organic light emitting diodes

Publikation aus Materials

Suess C., Wenzl F.P., Jakopic G., Wuchse M., Muehlegger S., Koch N., Haase A., Lamprecht K., Schatzmayr M., Mitterbauer C., Hofer F., Leising G.

Surf. Sci., 507-510 (2002), p. 464, 2004