Materials

Wissenschaftliche Publikation

Combined XPS, AFM, TEM and ellipsometry studies of nanoscale layers in organic light emitting diodes

Publikation aus Materials

Suess C., DI Dr. Franz-Peter Wenzl, DI Dr. Georg Jakopic, Wuchse M., Muehlegger S., Koch N., DIin Dr.in Anja Haase, Lamprecht K., Schatzmayr M., Mitterbauer C., Hofer F., Leising G.

Surf. Sci., 507-510 (2002), p. 464, 2004