Method

Electrical Device Characterisation

Parameter analyzer for electrical characterization of semiconductor devices and materials. Precise IV curve measurement.

Equipment

B1500A Parameter Analyzer / Keysight with PM5 MicroTec Probe Station / SÜSS
POT/GAL 30 V 2 A and Alpha-A Analyzer / Novo Control, 4 point probe stage

Method

The parameter analyzer measures current-voltage (IV) characteristics, pulse responses, and transient behaviors. The probe station facilitates precise sample probing in an isolated dark environment, ensuring noise-free measurements. High precision resistivity and sheet resistance can be measured with the 4-point probe technique. Impedance spectrometry determines the impedance or AC resistance of a sample as a function of frequency of the alternating current (AC).

Expected Result

Accurate determination of a material’s or electronic device’s electrical properties, crucial for evaluating conductive films, semiconductor(s) / devices, and thin film materials in e.g. electronic, optoelectronic and photovoltaic applications.

Case Study

Beside standard testing like capacitance and permittivity, a customer can analyze the electrical properties of batteries, super caps, or ferroelectric sensors. Impedance spectroscopy indicates aging of those samples over time or after heavy use. Organic thin film transistor performance is measured with the parameter analyzer.

Parameter Analyzer with probe station

Specifications

Parameter Analyzer B1500A / Keysight:

  • IV Measurement Range: 0.1 fA – 1 A / 0.5 µV – 200 V
  • Pulse Measurement: Advanced pulsed IV and ultra-fast IV with 5 ns sampling interval (200 MSa/s)
  • High Voltage: Up to 40 V pulse forcing for non-volatile memory evaluation
  • Software: EasyEXPERT group+

Probe Station PM5 MicroTec Probe Station / SÜSS:

  • Chuck Size: 6” vacuum chuck for sample stability
  • Probing: 3 triaxial and 4 coaxial probe heads with precise X, Y, Z movements
  • Microscope: Stereo zoom microscope for precise alignment
  • Isolation: Dark box for minimizing external interference
Parameter analyzer for electrical characterization of semiconductor devices and materials. Precise IV curve measurement.
Parameter analyzer for electrical characterization of semiconductor devices and materials. Precise IV curve measurement.

Impedance spectrometer POT/GAL 30 V 2 A and Alpha-A Analyzer – Novocontrol Technologies

Specifications

  • POT/GAL 30V 2A Short Specification
  • Counter Electrode Polarization
  • Reference Voltage Inputs
  • Working Electrode Current Input
  • Main Control Loop
  • Impedance Measurement
  • Basic Accuracy
  • Resolution

Methods

UV-VIS-IR Spectrometry

UV-Vis/NIR spectrometer for analyzing transmission, reflection, and absorption of solid and liquid samples. Ideal for optical material characterization in research and development.

Tensile Testing

The tensile testing machine enables precise measurement of tensile strength, elongation and modulus of elasticity of a wide range of materials in research, development and quality control.

Tribometry

Tribometer for analyzing friction, wear, and lubrication behavior under realistic testing conditions. Applicable in materials development and tribology research.
Show all methods

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