Ultramicrotome for preparing ultrathin cross-sections for analytical purposes. Essential for high-resolution layer and material investigations in nanoanalytics.
PowerTome XL / RMC Boeckeler
The ultramicrotome slices extremely thin layers (200 nm to 1µm) from samples. This enables a clear cut of the edge, thus a direct view onto the layered structure of a sample is possible. In addition, the cut off slices can be inspected independently. Typically, this method prepares the samples for further investigations using optical microscopy, fluorescence microscopy or scanning electron microscopy.
This process enables high-resolution analysis of layered or composite structures (e.g. layer thickness, aggregation behavior) and the quality of individual layers. Faulty areas and incompatibilities of layers amongst other problems might be identified.
A paper-based print circuit board hosts ink-based conductive lines on its surface as well as on its backside. Vertical interconnection accesses (VIAs) provide electrical connections between the lines. Using ultramicrotomy, the penetration of the ink into the porous structure of the paper as well as the VIA quality is analysed.
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