Methods

Chemical, Optical

UV-VIS-IR Spectrometry

UV-Vis/NIR spectrometer for analyzing transmission, reflection, and absorption of solid and liquid samples. Ideal for optical material characterization in research and development.
Electrical

Electrical Device Characterisation

Parameter analyzer for electrical characterization of semiconductor devices and materials. Precise IV curve measurement.
Mechanical

Tensile Testing

The tensile testing machine enables precise measurement of tensile strength, elongation and modulus of elasticity of a wide range of materials in research, development and quality control.
Mechanical

Tribometry

Tribometer for analyzing friction, wear, and lubrication behavior under realistic testing conditions. Applicable in materials development and tribology research.
Mechanical

Microscratch

The CSM Micro Scratch Tester enables the precise determination of adhesive strength, scratch resistance and failure mechanisms of thin layers and coatings.
Mechanical

Microindentation

Micro indentation tester for determining hardness and elastic modulus of thin films and materials. Standardized testing according to ISO and ASTM.
Cross section, Optical

Preparation Method: Polishing

Manual polishing system for surface preparation of materials for microscopic and analytical investigations.
Cross section

Preparation Method: Ultramicrotomy

Ultramicrotome for preparing ultrathin cross-sections for analytical purposes. Essential for high-resolution layer and material investigations in nanoanalytics.
Wetting

Static Contact Angle Measurement

Contact angle measurement device for determining surface energy, hydrophobicity, and wettability of solid samples.
Chemical

X-Ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy XPS for chemical surface analysis with nanometer-scale depth resolution. Suitable for nanoanalytics, surface modification, and coating investigations.
Optical

3D Surface Scanning

High-resolution 3D scanner for object digitization including color texture. Supports CAD modeling and additive manufacturing for research and industrial applications.
Optical

Luminance measurement and colorimetry

Luminance and color measurement system for high-resolution analysis of brightness and color distribution on displays and illuminated surfaces. Ideal for LED, OLED, and µLED evaluation.
Optical

Goniophotometry

Goniophotometer for angle-dependent measurement of photometric properties of luminaires.
Optical

Array spectroradiometry with integrating sphere

Precise measurement of luminous flux, color coordinates and spectra via integrating sphere – ideal for LED and display characterization.
Chemical, Optical

Fluorescence Microscopy

Fluorescence microscopy for analyzing biological markers, nanoparticle distribution, and microfluidic structures with high-quality imaging.
Optical

Variable Angle Spectroscopic Ellipsometry

Spectroscopic ellipsometry for determining optical constants and thin-film thicknesses. Used in photonics, semiconductor processing, and materials research.
Topography

Stylus Profilometry

Stylus surface profilometer with diamond tip for measuring topography and roughness on large sample areas.
Topography

Optical Profilometry

3D surface analysis, high-resolution, topography, microstructure, roughness, height images, optical imaging, layer boundaries, defects in the sub-micrometer range.
Topography

Scanning Electron Microscopy (SEM)

Scanning Electron Microscope (SEM) with EDS for high-resolution imaging and chemical element analysis of multilayer structures.
Electrical, Topography

Atomic Force Microscopy (AFM)

Atomic force microscopy (AFM) for high-resolution topography measurement for nanoanalysis and material characterization as well as analysis of piezoelectric properties.

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