Method

Preparation Method: Polishing

Manual polishing system for surface preparation of materials for microscopic and analytical investigations.

Equipment

A uniformly and precisely polished surface suitable for microscopic analysis and hardness testing. For optical waveguides and PICs, a precisely polished end face optimizes efficient light coupling with minimal signal loss. The system’s flexibility enables high consistency and precision, even with small or irregularly shaped components.

Method

FLex PIC & Waveguide Polisher / KrellTech
LaboPol-5 / Struers

Expected Result

A uniformly and precisely polished surface suitable for microscopic analysis and hardness testing. For optical waveguides and PICs, a precisely polished end face optimizes efficient light coupling with minimal signal loss. The system’s flexibility enables high consistency and precision, even with small or irregularly shaped components.

Case Study

An optical component manufacturer requires optimal surface quality for a waveguide to ensure maximum light transmission. Using waveguide polishing, the waveguide’s end face is polished to a precise smoothness thus reducing light scattering and enhancing coupling efficiency.

Waveguide polishing FLex PIC & Waveguide Polisher / KrellTech

Specifications

  • Sample size range:
    • Width: 5-25 mm
    • Thickness: 0.5-5 mm
    • Length: >5 mm
  • Polishing angle: 0-45°
  • Compatible components: PLCs, optical chips, fiber arrays
  • Holders: universal mount with two clamps for various sample sizes

Methods

UV-Vis/NIR spectrometer for analyzing transmission, reflection, and absorption of solid and liquid samples. Ideal for optical material characterization in research and development.

Parameter analyzer for electrical characterization of semiconductor devices and materials. Precise IV curve measurement.

The tensile testing machine enables precise measurement of tensile strength, elongation and modulus of elasticity of a wide range of materials in research, development and quality control.

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