Surface Characterization Lab
Measurement and analysis of the smallest structures, layers and components on a micro- and nanometre scale
AFM, credit JOANNEUM RESEARCH / Bernhard Bergmann
We offer measurements and analyses of the smallest structures, layers and components on a micro- and nanometer scale. Our methods include AFM, SEM (top or cross section view), XPS/UPS, SEM+EDX, confocal laser scanning microscopy, ellipsometry, UV-VIS-NIR spectroscopy or (X-ray) fluorescence analysis. Our methods are also suitable for flexible and soft materials like polymers, composites or layered systems (e.g. additively manufactured).
Learn more about our infrastructure of our Surface Characterization Lab.
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Other products and services
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