Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Publikation aus Materials

M. Neuschitzer, A. Moser, A. Neuhold, J. Kraxner, B. Stadlober, M. Oehzelt, I. Salzmann, R. Resel, and J. Novák

Journal of Applied Crystallography 45, 367–370 , 2012