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Materials

Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Beteiligte Autoren der JOANNEUM RESEARCH:
Autor*innen:
Neuhold, Alfred; Fladischer, Stefanie; Mitsche, Stefan; Flesch, Heinz-Georg; Moser, Armin; Novak, Jiri; Smilgies, Detlef M.; Kraker, Elke; Lamprecht, Bernhard; Haase, Anja; Grogger, Werner; Resel, Roland
Abstract:
The internal morphology and crystallographic properties of a complete organic thin film multilayer stack are characterized via x-ray scattering techniques, atomic force microscopy (AFM), and scanning electron microscopy. The stack consists of the three organic layers – copper(II)phthalocyanine (CuPc), perylene tetracarboxylic bisbenzimidazole (PTCBI), and aluminum-tris(8-hydroxychinolin) (Alq3) – sandwiched between an optically semitransparent gold layer and a top silver electrode. The interface roughness progress is determined by the x-ray reflectivity, which is confirmed by the surface roughness determination via AFM. The crystallographic properties are characterized via x-ray diffraction. The CuPc layer is highly crystalline with preferentially oriented crystallites but forms a rough interface (σRMS = 5.5 nm) toward the PTCBI layer. The PTCBI layer grows with randomly distributed crystallites in a worm-like morphology with an interface roughness of σRMS = 6.4 nm toward the Alq3 layer. The amorphous Alq3 layer acts as smoothing layer and reduces the roughness σRMS to 5.8 nm. Within this study we demonstrate the applicability of x-ray reflectivity in characterizing the interface morphology of an organic multilayer stack device.
Titel:
Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study
Seiten:
114911
Publikationsdatum
2011-12

Publikationsreihe

Nummer
110
Beitrag
11
ISSN
0021-8979
Proceedings
Journal of Applied Physics

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