Materials
Combined XPS, AFM, TEM and ellipsometry studies of nanoscale layers in organic light emitting diodes
Publication from Materials
Suess C., Wenzl F.P., Jakopic G., Wuchse M., Muehlegger S., Koch N., Haase A., Lamprecht K., Schatzmayr M., Mitterbauer C., Hofer F., Leising G.
Surf. Sci., 507-510 (2002), p. 464, 2004